线束端子压接成形过程与接触电阻的仿真分析

doi:10.16628/j.cnki.2095-8188.2026.03.002

摘要/Abstract

摘要：

线束端子的压接成形质量直接决定了其电连接可靠性。提出了一种基于ABAQUS有限元软件的线束端子压接成形过程与接触电阻的仿真分析方法,获得了挤压过程与回弹过程中线束端子的应力、接触面积与模具运动位移的关系,以及压接完成后的电势云图和接触电阻。对比有限元仿真结果与实验获得的线束端子剖切截面的形状、尺寸及接触电阻数据,验证了所提仿真分析方法的可行性与准确性。

关键词: 线束端子, 压接成形, 接触电阻, 有限元仿真, 接触面积

Abstract:

The electrical connection reliability of wire terminals is directly determined by their crimping quality.A simulation analysis method for the crimping formation process and contact resistance of the wire terminal is presented based on the commercial finite element software ABAQUS.The relationship among stress,contact area and die moving displacement during crimping and springback processes is obtained, as well as the potential distribution and contact resistance data after crimping completion.The feasibility and accuracy of the proposed simulation analysis method are verified by comparing the finite element simulation results with the shape, size and contact resistance of the cross-section of wire terminals obtained from experiments.

Key words: wire terminals, crimping formation, contact resistance, finite element simulation, contact area

中图分类号:

TM743

孙立志, 张超, 任万滨. 线束端子压接成形过程与接触电阻的仿真分析[J]. 电器与能效管理技术, 2026, 0(3): 10-16.

SUN Lizhi, ZHANG Chao, REN Wanbin. Simulation Analysis of Crimping Formation Process and Contact Resistance of Wire Terminals[J]. LOW VOLTAGE APPARATUS, 2026, 0(3): 10-16.

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零件名称	参数	数值
端子	长度L_g/mm	1.5
	宽度W_g/mm	1.8
	高度H_g/mm	1.5
导线	直径Φ_w/mm	0.16
导线	数量N_w/个	17
上模具	圆弧半径R_d1/mm	0.28
下模具	宽度W_d2/mm	1.1
	圆弧半径R_d2/mm	0.60
	深度H_d2/mm	0.17

材料
磷青铜(端子)	密度ρ_g/(kg·m^-3)	8 800
	弹性模量E_g/GPa	130
	泊松比ν_g	0.30
紫铜(导线)	密度ρ_w/(kg·m^-3)	8 960
	弹性模量E_w/GPa	110
	泊松比ν_w	0.35