电器与能效管理技术 ›› 2021, Vol. 0 ›› Issue (6): 63-66.doi: 10.16628/j.cnki.2095-8188.2021.06.011

• 检测与试验 • 上一篇    下一篇

基于控制器硬件在环的SVG模型参数测试方法

曹斌1, 丛雨1, 原帅1, 张晓琳2, 王琪1, 王立强1, 赵永飞1   

  1. 1.内蒙古电力科学研究院, 内蒙古 呼和浩特 010000
    2.中国电力科学研究院有限公司, 江苏 南京 210003
  • 收稿日期:2021-02-25 出版日期:2021-06-30 发布日期:2021-10-13
  • 作者简介:曹 斌(1981—),女,高级工程师,主要从事高电压与绝缘相关研究。|丛 雨(1983—),男,高级工程师,主要从事新能源并网技术研究。|原 帅(1990—),男,工程师,主要从事新能源电力系统仿真分析工作。

SVG Model Parameter Test Method Based on Controller Hardware-in-Loop

CAO Bin1, CONG Yu1, YUAN Shuai1, ZHANG Xiaolin2, WANG Qi1, WANG Liqiang1, ZHAO Yongfei1   

  1. 1. Inner Mongolia Power Research Institute,Huhhot 010000,China
    2. China Electric Power Research Institute,Nanjing 210003,China
  • Received:2021-02-25 Online:2021-06-30 Published:2021-10-13

摘要:

针对电压等级高、容量大等特点,现有检测装置无法满足模型参数测试需求的问题,提出基于控制器硬件在环的SVG模型参数测试方法。首先基于电力系统仿真分析要求,提出SVG模型参数需求并选取测试工况,然后建立控制器硬件在环仿真的模型参数测试平台,对SVG核心部件——控制器开展模型参数测试,随后将硬件在环测试数据作为实测数据开展SVG模型参数计算工作。最后,基于某SVG测试案例验证所提方法的可行性与正确性。

关键词: 静止无功发生器(SVG), 硬件在环测试, 参数测试, 参数计算

Abstract:

As the main reactive power source of new energy power station,static var generator(SVG) needs to provide its model parameters to the dispatching organization.However,due to the high voltage level and large capacity of SVG,the existing detection devices can not meet the requirements of model parameter test.To solve this problem,this paper proposes a hardware-in-the-loop(HIL) testing method for SVG model parameters.Firstly,based on the requirements of power system simulation analysis,the parameter requirements of SVG model are proposed and the test conditions are selected.Then,a model parameter test platform for controller hardware in the loop simulation is established to test the model parameters of the controller,which is the core component of SVG.Then,the hardware in the loop test data are used as the measured data to carry out the SVG model parameter identification.Finally,an SVG test case is used to verify the feasibility and correctness of the proposed method.

Key words: static var generator(SVG), hardware-in-loop, parameter test, parameter identification

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