LOW VOLTAGE APPARATUS ›› 2026, Vol. 0 ›› Issue (3): 10-16.doi: 10.16628/j.cnki.2095-8188.2026.03.002
• Research & Analysis • Previous Articles Next Articles
SUN Lizhi, ZHANG Chao, REN Wanbin
Received:2025-12-12
Online:2026-03-30
Published:2026-04-20
CLC Number:
SUN Lizhi, ZHANG Chao, REN Wanbin. Simulation Analysis of Crimping Formation Process and Contact Resistance of Wire Terminals[J]. LOW VOLTAGE APPARATUS, 2026, 0(3): 10-16.
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