基于开关瞬态振荡过程的半导体器件输出结电容测量方法研究
李昊阳, 郑艳文, 李皓, 陈瑞文, 胡斯登
Research on Measurement Method for Output Junction Capacitance of Semiconductor Devices Based on Transient Switching Oscillation Process
LI Haoyang, ZHENG Yanwen, LI Hao, CHEN Ruiwen, HU Sideng
电器与能效管理技术
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2024, (10): 42
-47
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DOI: 10.16628/j.cnki.2095-8188.2024.10.007
