Discussion on Technical Differences Between Standard GB/T 18859—2016 and GB/Z 18859—2002
CHEN Xiyan, TIAN Huichao, YANG Long
China National Quality Supervision and Testing Center for Smart Grid Transmission and Distribution Equipment,Guang’an Electrical Testing Certer (Guangdong) Co.,Ltd,Dongguan 523325,China
CHEN Xiyan, TIAN Huichao, YANG Long. Discussion on Technical Differences Between Standard GB/T 18859—2016 and GB/Z 18859—2002[J]. DIANQI YU NENGXIAO GUANLI JISHU, 2018, 0(10): 85-88.
[1] 封闭式低压成套开关设备和控制设备在内部故障引起电弧情况下的试验导则:GB/T 18859—2016[S]. [2] Enclosed low-voltage switchgear and controlgear assemblies—Guide for testing under conditions of arcing due to internal fault:IEC/TR 61641—2014[S]. [3] 封闭式低压成套开关设备和控制设备在内部故障引起电弧情况下的试验导则:GB/Z 18859—2002[S]. [4] 低压成套开关设备和控制设备 第1部分:总则:GB/T 7251.1—2013[S]. [5] Enclosed low-voltage switchgear and controlgear assemblies-Guide for testing under conditions of arcing due to internal fault:IEC/TR 61641—2008[S].