Life Prediction Method of Electromagnetic Contactor Based on Overtravel Time Degradation Characteristics

doi:10.16628/j.cnki.2095-8188.2024.02.011

Abstract

Abstract:

Starting from the failure mechanism of contactors, a detailed analysis of the overtravel time degradation process is conducted through the finite element and dynamic simulation. A life prediction method for electromagnetic contactors based on the overtravel time degradation characteristics is proposed. A life prediction model for electromagnetic contactors based on the overtravel time degradation characteristics is established. A reliability testing platform for contactors is designed and built. The remaining life of contactors is analyzed and predicted based on SJD-10048NK electromagnetic contactor testing data with a relative error of about 10%. The effectiveness of the proposed method is verified. The results indicate that the proposed method can accurately predict the life of contactors, which has important guiding significance for the reliability status evaluation and maintenance management of contactors.

Key words: electromagnetic contactor, overtravel time, degenerate model, life prediction

CLC Number:

TM572.6

CHEN Sheng, LIU Liang, SUN Kaige. Life Prediction Method of Electromagnetic Contactor Based on Overtravel Time Degradation Characteristics[J]. LOW VOLTAGE APPARATUS, 2024, 0(2): 66-71.

Figures/Tables 11

References 19

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触头间隙/ mm	吸合时间/ ms	超程结束时间/ms	超程时间/ ms
2.10	17.38	18.00	0.62
2.09	17.37	18.00	0.63
2.08	17.27	18.00	0.73
2.07	17.18	18.00	0.82
2.06	17.19	18.00	0.81
2.05	16.96	18.00	1.04
2.04	16.99	18.00	1.01
2.03	16.88	18.00	1.12
2.02	16.81	18.00	1.19
2.01	16.69	18.00	1.30

超程时间/ ms	剩余寿命					预测误差/ %
超程时间/ ms	预测值/次	实际值/次		差值/次		预测误差/ %
2.00	94 983		93 913		1 070	1.14
1.90	80 503		84 713		4 210	4.97
1.80	66 352		69 113		2 761	3.99
1.70	52 442		52 713		271	0.51