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Research on Measurement Method for Output Junction Capacitance of Semiconductor Devices Based on Transient Switching Oscillation Process
LI Haoyang, ZHENG Yanwen, LI Hao, CHEN Ruiwen, HU Sideng
LOW VOLTAGE APPARATUS . 2024, (
10
): 42 -47 . DOI: 10.16628/j.cnki.2095-8188.2024.10.007
