Analysis of Differential Protection Misoperation Caused by CT Saturation Outside Line Fault

LI Chun, HAN Jianke, GU Hongbo, ZHANG Neng, QIAN Huimin, WANG Ye

LOW VOLTAGE APPARATUS . 2020, (12): 109 -113 . DOI: 10.16628/j.cnki.2095-8188.2020.12.019