Analysis on the Impact of Increasing Data Center Ambient Temperature to 32 ℃ on the Reliability of Miniature Circuit Breakers in Existing AC Header Cabinets

YANG Rui, LI Xiaofeng, CHEN Jiajun, XU Nanjun

LOW VOLTAGE APPARATUS . 2026, (1): 71 -75 . DOI: 10.16628/j.cnki.2095-8188.2026.01.010