Structural Design and Practical Effect of Clapping Relay Armature Inner Chamfer Testing Device
LI Qing Shi1, FAN Yi Chuan2, LUO Wen Tian1
1. Shenyang Railway Signal Co.,Ltd., Shenyang 110000, China 2. Institute of Reliability in Electrical Apparatus and Electronics,Harbin Institute of Technology, Harbin 150001, China
LI Qing Shi, FAN Yi Chuan, LUO Wen Tian. Structural Design and Practical Effect of Clapping Relay Armature Inner Chamfer Testing Device[J]. LOW VOLTAGE APPARATUS, 2024, 0(1): 38-42.